Yaya TRAORE ; Cheikh Talibouya DIOP ; Sadouanouan MALO ; Moussa Lo ; Stanislas Ouaro - Discovering frequent patterns guided by an ontology

arima:2558 - Revue Africaine de la Recherche en Informatique et Mathématiques Appliquées, December 7, 2016, Volume 25 - 2016 - Special issue CNRIA 2015 - https://doi.org/10.46298/arima.2558
Discovering frequent patterns guided by an ontology

Authors: Yaya TRAORE ; Cheikh Talibouya DIOP ; Sadouanouan MALO ; Moussa Lo ; Stanislas Ouaro

The frequent pattern mining generates a huge amount of patterns and therefore requires the establishment of an effective post-treatment to target the most useful. This paper proposes an approach to discover the useful frequent patterns that integrates knowledge described by the expert and represented in an ontology associated with the data. The approach uses the ontology for benefit from more structured information to remove some frequent patterns of the analysis. The experiments realized with our approach give satisfactory results.


Volume: Volume 25 - 2016 - Special issue CNRIA 2015
Published on: December 7, 2016
Submitted on: November 29, 2016
Keywords: Ontology,Frequent pattern,data mining,Ontologie,Motifs frequents,Fouille de données,[INFO] Computer Science [cs]


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